• DocumentCode
    2749343
  • Title

    The method of intelligent operation of circuit breaker to reduce overvoltage

  • Author

    Chen Xiaoning ; Siarry, Patrick ; Zhou Bihua ; Huang Shunji

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2003
  • fDate
    4-7 Nov. 2003
  • Firstpage
    103
  • Lastpage
    107
  • Abstract
    Operating overvoltage appears when a circuit breaker, especially a high-voltage circuit breaker, opens and closes, which causes strong electromagnetic interference (EMI) and even damage to power and electrical equipment near the circuit breaker We analyze the factors which create operating overvoltage. Based on the breakdown theory of critical electric strength, the sensitivity of the gap between open contacts to the non-uniform coefficient of electric field is considered, the characteristics of dielectric recovery are calculated, methods of reducing or avoiding the operating overvoltage are put forward. They are realized by changing the simple moving characteristics of the circuit breaker, such as the initial phase confirmed in closing, the current phase selected and the diameter of the drain oil aperture of the operating mechanism being adjusted in the opening of an intelligent operation circuit breaker.
  • Keywords
    circuit breakers; electric breakdown; electric strength; electromagnetic interference; overvoltage; EMI; circuit breaker intelligent operation; critical electric strength; current phase; dielectric recovery; electrical breakdown theory; electromagnetic interference; initial phase; moving characteristics; overvoltage reduction; Apertures; Circuit analysis; Circuit breakers; Contacts; Dielectric breakdown; Electromagnetic analysis; Electromagnetic interference; Nonuniform electric fields; Petroleum; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, 2003. CEEM 2003. Proceedings. Asia-Pacific Conference on
  • Conference_Location
    Hangzhou, China
  • Print_ISBN
    7-5635-0802-3
  • Type

    conf

  • DOI
    10.1109/CEEM.2003.238596
  • Filename
    1282254