Mismatch analysis using pulsed electro-optic sampling at KRISS

Author

Lee, Dong-Joon ; Kwon, Jae-Yong ; Lee, Joo-Gwang ; Kang, No-Weon

Author_Institution

Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea

fYear

2012

fDate

1-6 July 2012

Firstpage

448

Lastpage

449

Abstract

A mismatch analysis system for microwave devices based on the electro-optic sampling technique is presented. We, KRISS (Korea Research Institute of Standards and Science), have recently developed a time domain electro-optic sampling system for high speed pulse analysis and utilized it to explore mismatch characteristics of a microwave device under test in the spectral domain. The performance of our system, based on pulse measurements in both time and frequency domains, are presented by exploring mismatches of a microwave device associated with a 20 GHz transmission line.

Keywords

electro-optical devices; electro-optical effects; frequency-domain analysis; high-speed optical techniques; microwave devices; pulse measurement; time-domain analysis; KRISS; Korea Research Institute of Standards and Science; frequency 20 GHz; frequency domain analysis; high speed pulse analysis; microwave device; mismatch analysis system; pulse measurement; pulsed electrooptic sampling technique; spectral domain testing; time domain electrooptic sampling system; transmission line; Microwave measurements; Optical filters; Optical pulses; Pulse measurements; Reflection; Transmission line measurements; Ultrafast optics; Oscilloscope; electro-optic sampling; electromagnetic pulse measurement; pump-probe experiment;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250996

Filename

6250996