• DocumentCode
    2749498
  • Title

    Displacement sensor for detecting sub-micrometer motion

  • Author

    Avramov-Zamurovic, Svetlana ; Yoo, Jae Myung ; Dagalakis, Nicholas G. ; Lee, Rae Duk

  • Author_Institution
    United States Naval Acad., Annapolis, MD, USA
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    458
  • Lastpage
    459
  • Abstract
    This paper describes a design of a displacement sensor that detects motion of a platform by measuring change in capacitance due to the fringing electric field. Several variations of the sensor´s design were simulated to establish performance sensitivity and the simulation results are presented. Proof of concept testing was performed and encouraging outcomes were recorded. The sensor was able to detect motion of a platform with resolution of 100 nm or better at the distance of several micrometers.
  • Keywords
    capacitance measurement; displacement measurement; microsensors; displacement sensor; fringing electric field; performance sensitivity; proof of concept testing; size 100 nm; submicrometer motion detection; Capacitance; Capacitance measurement; Conductors; Displacement measurement; Electrodes; Sensitivity; Wires; Capacitance measurement; displacement measurement; nano-size positioners; nanotechnology; sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6251001
  • Filename
    6251001