DocumentCode
2749498
Title
Displacement sensor for detecting sub-micrometer motion
Author
Avramov-Zamurovic, Svetlana ; Yoo, Jae Myung ; Dagalakis, Nicholas G. ; Lee, Rae Duk
Author_Institution
United States Naval Acad., Annapolis, MD, USA
fYear
2012
fDate
1-6 July 2012
Firstpage
458
Lastpage
459
Abstract
This paper describes a design of a displacement sensor that detects motion of a platform by measuring change in capacitance due to the fringing electric field. Several variations of the sensor´s design were simulated to establish performance sensitivity and the simulation results are presented. Proof of concept testing was performed and encouraging outcomes were recorded. The sensor was able to detect motion of a platform with resolution of 100 nm or better at the distance of several micrometers.
Keywords
capacitance measurement; displacement measurement; microsensors; displacement sensor; fringing electric field; performance sensitivity; proof of concept testing; size 100 nm; submicrometer motion detection; Capacitance; Capacitance measurement; Conductors; Displacement measurement; Electrodes; Sensitivity; Wires; Capacitance measurement; displacement measurement; nano-size positioners; nanotechnology; sensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location
Washington, DC
ISSN
0589-1485
Print_ISBN
978-1-4673-0439-9
Type
conf
DOI
10.1109/CPEM.2012.6251001
Filename
6251001
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