• DocumentCode
    2749510
  • Title

    Frequency comb referenced displacement interferometry for the NIST calculable capacitor

  • Author

    Durand, Mathieu ; Lawall, John ; Wang, Yicheng

  • Author_Institution
    Nat. Inst. Of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    460
  • Lastpage
    461
  • Abstract
    This paper describes the ongoing work on measuring the variable spacing between two electrodes in the next-generation NIST calculable capacitor. The spacing measurement is based on a high finesse Fabry-Perot interferometer system where displacements are inferred from optical frequency measurements. Using a frequency comb referenced to an atomic clock as an optical frequency standard, we achieve a fractional uncertainty of δν/ν ~ 2·10-11 at 2 seconds. This corresponds to a stabilization of the spacing at the picometer level.
  • Keywords
    Fabry-Perot interferometers; atomic clocks; capacitors; electrodes; frequency measurement; measurement standards; optical variables measurement; NIST calculable capacitor; atomic clock; electrode variable spacing; frequency comb referenced displacement interferometry; high finesse Fabry-Perot interferometer; optical frequency measurement; optical frequency standard; Atom optics; Cavity resonators; Electrodes; Frequency measurement; Optical interferometry; Optical variables measurement; Uncertainty; calculable capacitor; displacement metrology; frequency comb; frequency metrology; length stabilization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6251002
  • Filename
    6251002