Title :
Progress towards a combined CIM/MoM approach for EMI analysis of electronic systems
Author :
Duan, Xiaomin ; Vogt, Alexander ; Brüns, Heinz Dietrich ; Schuster, Christian
Author_Institution :
Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
Abstract :
This paper presents a multi-step approach for the modeling of radiated emissions of electronic systems. Due to the high complexity and high aspect ratio of the inner structures of a printed circuit board (PCB), full wave modeling of a system including the external environment and enclosures is usually unrealistic. In this multi-step approach, the system is decomposed into internal and external domains by the PCB surfaces. The interior domain is first solved using the contour integral method to obtain equivalent surface currents, which serve as excitations for the method of moments to solve the external domain. Here, we focus on the radiation from the board edges by assuming solid plates on both upper and lower sides of the PCB. Various configurations will be analyzed to study the impact of exterior structures on the radiated emission of the system. The impact of the coupling from the scattered field back to the PCB will be discussed.
Keywords :
electromagnetic interference; method of moments; printed circuits; EMI analysis; combined CIM/MoM approach; contour integral method; coupling impact; electronic systems; equivalent surface currents; external domains; external environment; full wave modeling; inner structures; internal domains; method of moments; multistep approach; printed circuit board; radiated emissions; scattered field; solid plates; Cavity resonators; Computer integrated manufacturing; Electric fields; Electromagnetic interference; Impedance; Integrated circuit modeling; Moment methods; contour integral method; electromagnetic interference; method of moments; printed circuit board; radiated emissions;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4673-0718-5
DOI :
10.1109/EMCEurope.2012.6396734