• DocumentCode
    2749958
  • Title

    Novel applications of HEMTs for future 4.2 K low-power and low-frequency cryoelectronics

  • Author

    Jin, Y.

  • Author_Institution
    CNRS, Bagneux, France
  • fYear
    1997
  • fDate
    8-11 Sep 1997
  • Firstpage
    491
  • Lastpage
    494
  • Abstract
    Pseudomorphic (Al,In)GaAs/GaAs HEMTs have been fabricated and investigated. These devices exhibit high DC and low-frequency noise performances at 4.2 K. Neither collapse nor kink effect have been detected. Large current variation from sub-nano to milli-Ampere with good saturation behaviour has been characterised with a gate bias variation of about half a volt. Even at an extremely low-power supply of 57 pW, an intrinsic voltage gain of 160 has been reached. With a power supply smaller than 10 μW, we obtained an equivalent input noise as small as 1.9 nV/√Hz at 1 kHz, a white noise lower than 0.5 nV/√Hz, a shot noise of 0.76 fA/√Hz,and the corresponding Hooge parameter of 5.5×10-6. Finally, a real application of this type of device in a 4.2 K preamplifier has demonstrated an equivalent input noise level of 0.12 nV/√Hz with a bandwidth of 2 MHz
  • Keywords
    1/f noise; III-V semiconductors; aluminium compounds; cryogenic electronics; gallium arsenide; high electron mobility transistors; indium compounds; low-power electronics; preamplifiers; semiconductor device noise; shot noise; white noise; 1 kHz; 2 MHz; 4.2 K; 57 pW to 10 muW; AlInGaAs-GaAs; DC noise; Hooge parameter; equivalent input noise; gate bias variation; intrinsic voltage gain; low-frequency cryoelectronics; low-frequency noise; low-power cryoelectronics; preamplifier; pseudomorphic HEMTs; saturation behaviour; shot noise; white noise; Bandwidth; Gallium arsenide; HEMTs; Low-frequency noise; MODFETs; Noise level; Power supplies; Preamplifiers; Voltage; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 1997 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7503-0556-8
  • Type

    conf

  • DOI
    10.1109/ISCS.1998.711722
  • Filename
    711722