DocumentCode
2750048
Title
What can limit the quantum Hall effect quantization in graphene?
Author
Guignard, J. ; Glattli, D.C. ; Schopfer, F. ; Poirier, W.
Author_Institution
Quantum Metrol. Group, Lab. Nat. de Metrol. et d´´Essais, Trappes, France
fYear
2012
fDate
1-6 July 2012
Firstpage
516
Lastpage
517
Abstract
We report on investigations about limitations of the Hall resistance quantization accuracy (4×10-7) measured in Hall bars based on monolayer and bilayer exfoliated graphene deposited on Si/SiO2 substrates (best results in such devices). Transport measurements at low magnetic field (including quantum corrections) reveal that charge carrier scattering is mainly caused by charged impurities. In the QHE regime, dissipation occurs through quasi-elastic inter-Landau level (LL) scattering assisted by large local electric fields. We propose that charged impurities are responsible for an enhancement of such inter-LL transitions and cause the low breakdown currents (≈1μA) observed in the narrow (<;4μm) samples considered.
Keywords
Landau levels; bars; electric breakdown; graphene; quantum Hall effect; quasi-elastic scattering; C; Hall bar measurement; Hall resistance quantization; LL; QHE; Si-SiO2; bilayer exfoliated graphene deposition; breakdown current; charge carrier scattering; charge impurity; electric field; magnetic field; monolayer exfoliated graphene deposition; quantum Hall effect quantization; quantum correction; quasielastic interLandau level scattering dissipation; transport measurement; Current measurement; Electric breakdown; Electric fields; Electrical resistance measurement; Impurities; Resistance; Scattering; electronic transport; graphene; quantum Hall effect; quantum electrical metrology;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location
Washington, DC
ISSN
0589-1485
Print_ISBN
978-1-4673-0439-9
Type
conf
DOI
10.1109/CPEM.2012.6251030
Filename
6251030
Link To Document