Title :
What can limit the quantum Hall effect quantization in graphene?
Author :
Guignard, J. ; Glattli, D.C. ; Schopfer, F. ; Poirier, W.
Author_Institution :
Quantum Metrol. Group, Lab. Nat. de Metrol. et d´´Essais, Trappes, France
Abstract :
We report on investigations about limitations of the Hall resistance quantization accuracy (4×10-7) measured in Hall bars based on monolayer and bilayer exfoliated graphene deposited on Si/SiO2 substrates (best results in such devices). Transport measurements at low magnetic field (including quantum corrections) reveal that charge carrier scattering is mainly caused by charged impurities. In the QHE regime, dissipation occurs through quasi-elastic inter-Landau level (LL) scattering assisted by large local electric fields. We propose that charged impurities are responsible for an enhancement of such inter-LL transitions and cause the low breakdown currents (≈1μA) observed in the narrow (<;4μm) samples considered.
Keywords :
Landau levels; bars; electric breakdown; graphene; quantum Hall effect; quasi-elastic scattering; C; Hall bar measurement; Hall resistance quantization; LL; QHE; Si-SiO2; bilayer exfoliated graphene deposition; breakdown current; charge carrier scattering; charge impurity; electric field; magnetic field; monolayer exfoliated graphene deposition; quantum Hall effect quantization; quantum correction; quasielastic interLandau level scattering dissipation; transport measurement; Current measurement; Electric breakdown; Electric fields; Electrical resistance measurement; Impurities; Resistance; Scattering; electronic transport; graphene; quantum Hall effect; quantum electrical metrology;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251030