• DocumentCode
    2750048
  • Title

    What can limit the quantum Hall effect quantization in graphene?

  • Author

    Guignard, J. ; Glattli, D.C. ; Schopfer, F. ; Poirier, W.

  • Author_Institution
    Quantum Metrol. Group, Lab. Nat. de Metrol. et d´´Essais, Trappes, France
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    516
  • Lastpage
    517
  • Abstract
    We report on investigations about limitations of the Hall resistance quantization accuracy (4×10-7) measured in Hall bars based on monolayer and bilayer exfoliated graphene deposited on Si/SiO2 substrates (best results in such devices). Transport measurements at low magnetic field (including quantum corrections) reveal that charge carrier scattering is mainly caused by charged impurities. In the QHE regime, dissipation occurs through quasi-elastic inter-Landau level (LL) scattering assisted by large local electric fields. We propose that charged impurities are responsible for an enhancement of such inter-LL transitions and cause the low breakdown currents (≈1μA) observed in the narrow (<;4μm) samples considered.
  • Keywords
    Landau levels; bars; electric breakdown; graphene; quantum Hall effect; quasi-elastic scattering; C; Hall bar measurement; Hall resistance quantization; LL; QHE; Si-SiO2; bilayer exfoliated graphene deposition; breakdown current; charge carrier scattering; charge impurity; electric field; magnetic field; monolayer exfoliated graphene deposition; quantum Hall effect quantization; quantum correction; quasielastic interLandau level scattering dissipation; transport measurement; Current measurement; Electric breakdown; Electric fields; Electrical resistance measurement; Impurities; Resistance; Scattering; electronic transport; graphene; quantum Hall effect; quantum electrical metrology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6251030
  • Filename
    6251030