• DocumentCode
    2750287
  • Title

    The effect of DAC clock jitter on the RMS value of digitally synthesized AC voltage

  • Author

    Kampik, Marian ; Popek, Grzegorz

  • Author_Institution
    Silesian Univ. of Technol., Gliwice, Poland
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    542
  • Lastpage
    543
  • Abstract
    The paper describes the effect of the digital-to-analog converter (DAC) jittered clock signal on the effective (RMS) value of digitally synthesized sinusoidal signal. The article contains the mathematical model of that effect and comparison between results obtained with the mathematical model and by numerical simulations. The simple equation obtained with the mathematical model allows to estimate uncertainty component due to clock jitter of the voltage generated by the digitally synthesized sources of sinusoidal voltages used in quantum and non-quantum AC voltage standards and allows to specify requirements for the DAC clock generation circuit. The analysis presented is general and its result can be used for determination of uncertainty of the effective value of any uniformly sampled sinusoidal signal disturbed by jitter.
  • Keywords
    clocks; digital-analogue conversion; jitter; mathematical analysis; measurement standards; numerical analysis; voltage measurement; DAC clock generation circuit; DAC clock jitter effect; RMS value; digital-to-analog converter; digitally synthesized AC voltage; digitally synthesized sinusoidal signal; mathematical model; nonquantum AC voltage standard; numerical simulation; quantum AC voltage standard; uncertainty component estimation; uniformly sampled sinusoidal signal disturbance; voltage generation; Clocks; Decision support systems; Jitter; Mathematical model; Numerical simulation; Standards; Uncertainty; AC voltage standard; digital signal synthesis; digital-to-analog converter; effective value; jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6251043
  • Filename
    6251043