Investigating the use of multimeters to measure high value capacitors at low frequencies against the quantized Hall resistance

Author

Satrapinski, A. ; Suomalainen, E.P. ; Immonen, P.

Author_Institution

MIKES, Espoo, Finland

fYear

2012

fDate

1-6 July 2012

Firstpage

576

Lastpage

577

Abstract

Possibilities and limitations of using measurement system based on two sampling multimeters (DVM) for the ratio measurement of two impedances was investigated in MIKES. Calibration of a 1 μF capacitor from the quantized Hall resistance (QHR) was made at low frequencies. A frequency dependence of ceramic 1 μF capacitor in frequency range 12 Hz - 1600 Hz was measured against different reference resistors at low voltage level with the ratios of 1:1 to 1:100. A 1 μF capacitor can be measured at low frequency directly against the QHR by using precision DVM with proper estimation of applied corrections.

Keywords

calibration; capacitance measurement; capacitors; digital multimeters; electric resistance measurement; measurement systems; radiofrequency measurement; resistors; DVM; MIKES; QHR; capacitance 1 muF; capacitor calibration; frequency 12 Hz to 1600 Hz; high value capacitor measurement; impedance measurement; measurement system; quantized Hall resistance; reference resistors; sampling multimeters; Bridge circuits; Capacitors; Electrical resistance measurement; Frequency measurement; Measurement uncertainty; Uncertainty; Voltage measurement; High value capacitors; calibration; low frequency; measurement uncertainty; precision measurements; voltage sampling;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251060

Filename

6251060