Title :
All-optical wavelength conversion of a high-speed RZ-OOK signal in a silicon nanowire
Author :
Hu, Haibo ; Ji, Hong ; Galili, Michael ; Pu, M. ; Mulvad, H.C.H. ; Yvind, Kresten ; Hvam, J.M. ; Jeppesen, P. ; Oxenlowe, Leif K. ; Oxenløwe, L.K.
Author_Institution :
DTU Fotonik, Tech. Univ. of Denmark, Lyngby, Denmark
Abstract :
All-optical wavelength conversion of a 320 Gb/s line-rate RZ-OOK signal is demonstrated based on four-wave mixing in a 3.6 mm long silicon nanowire. Bit error rate measurements validate the performance within FEC limits.
Keywords :
error statistics; multiwave mixing; nanophotonics; nanowires; silicon; FEC limits; Si; all optical wavelength conversion; bit error rate measurements; bit rate 320 Gbit/s; four wave mixing; high speed RZ OOK signal; silicon nanowire; Bit error rate; Optical fiber dispersion; Optical fibers; Optical wavelength conversion; Silicon; Wavelength measurement; Nonlinear optics; Wavelength conversion; silicon nanowire;
Conference_Titel :
Photonics Conference (PHO), 2011 IEEE
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4244-8940-4
DOI :
10.1109/PHO.2011.6110688
