Title :
A characterization technique for near-field probes
Author :
Bodnar, Donald G.
Author_Institution :
Georgia Institute of Technology, Atlanta, GA, USA
Keywords :
Apertures; Costs; Current measurement; Electric variables measurement; Equations; Force measurement; Frequency measurement; Position measurement; Probes; System testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1977
DOI :
10.1109/APS.1977.1147754
