DocumentCode
2750643
Title
A characterization technique for near-field probes
Author
Bodnar, Donald G.
Author_Institution
Georgia Institute of Technology, Atlanta, GA, USA
Volume
15
fYear
1977
fDate
28277
Firstpage
374
Lastpage
377
Keywords
Apertures; Costs; Current measurement; Electric variables measurement; Equations; Force measurement; Frequency measurement; Position measurement; Probes; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1977
Type
conf
DOI
10.1109/APS.1977.1147754
Filename
1147754
Link To Document