Title :
Local Maximum Component-labeling Based on Parallel Local Operation Sequence for Layout Analysis
Author :
Li, Feng ; Wu, Wei
Author_Institution :
Dept. of Appl. Math., Dalian Univ. of Technol.
Abstract :
A definition of the local maximum component (the component for short) is presented for layout analysis in document image analysis (DIA), and a novel algorithm for component labeling was described. This algorithm uses a contour tracing technique to detect and label the external contour of each component, and removes the interior area of each component from the copy of the source image. Labeling and removing are completed in a single pass over source image. Experiments on various kinds of images (title, text, picture, table and formula) show that the new definition and algorithm are more efficient and flexible than the traditional labeling ones
Keywords :
document image processing; contour tracing; document image analysis; layout analysis; local maximum component labeling; parallel local operation sequence; Algorithm design and analysis; Automation; Bismuth; Image analysis; Image sequence analysis; Intelligent control; Labeling; Mathematics; Neural networks; Text analysis; component-labeling algorithm; layout analysis; local maximum component; parallelizable;
Conference_Titel :
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0332-4
DOI :
10.1109/WCICA.2006.1714064