• DocumentCode
    2751288
  • Title

    Development of an electro-optic sampling system at LNE

  • Author

    Tian, Wei ; Allal, Djamel ; Boudebs, Georges ; Charles, Michaël ; Ndiaye, Oumy ; Vincent, Patricia

  • Author_Institution
    Lab. Nat. de Metrol. et d´´Essais (LNE), Trappes, France
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    654
  • Lastpage
    655
  • Abstract
    We present the development of an electro-optic sampling system for the calibration of an electrical impulse response standard photodiode. The configuration uses a 100 μm thick LiTaO3 or GaAs electro-optic crystal placed above a coplanar waveguide supported by a glass substrate. Transverse dimensions of the coplanar waveguide are adjusted in order to obtain a good impedance match between the free sections of the coplanar waveguide and the section covered by the electro-optic crystal. The electro-optic sampling system uses a mode-locked fiber laser producing a train of pulses at 1550 nm with pulse duration of about 90 fs.
  • Keywords
    calibration; coplanar waveguides; electro-optical devices; fibre lasers; impedance matching; photodiodes; transient response; LNE; calibration; coplanar waveguide; electrical impulse response standard photodiode; electro-optic sampling system; electrooptic crystal; glass substrate; impedance matching; mode-locked fiber laser; size 100 mum; transverse dimension; wavelength 1550 nm; Calibration; Coplanar waveguides; Crystals; Electrooptic effects; Electrooptical waveguides; Photodiodes; Probes; Coplanar waveguide; electro-optic sampling; oscilloscope calibration; photodiode calibration; waveform metrology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6251099
  • Filename
    6251099