DocumentCode :
2751652
Title :
S-parameter resonance method for the calibration of standard capacitors
Author :
Özkan, Turgay ; Gülmez, Gülay ; Gülmez, Yakup ; Turhan, Enis ; Neli, N. Berna Te
Author_Institution :
TUBITAK Ulusal Metroloji Enstitusu, Gebze, Turkey
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
692
Lastpage :
693
Abstract :
National Metrology Institute of Turkey (TÜBİTAK UME) has developed a new approach for the characterization of Agilent 16380A-type four-terminal-pair (4TP) air dielectric capacitance standards in the range of 1 pF to 1000 pF up to 30 MHz. This method is based on determining all residual inductive parameters of 4TP standard air dielectric capacitors from resonance frequencies. These resonance frequencies were calculated using impedance and admittance values obtained from scattering parameter measurements up to 500 MHz employing a vector network analyzer. Capacitive residual parameters were measured by using a 1 kHz capacitance bridge.
Keywords :
S-parameters; calibration; capacitance measurement; capacitors; network analysers; 4TP standard air dielectric capacitor; Agilent 16380A-type 4TP; Agilent 16380A-type four-terminal-pair; National Metrology Institute of Turkey; S-parameter resonance method; TÜBİTAK UME; air dielectric capacitance standard; calibration; capacitance 1 pF to 1000 pF; capacitive residual parameter measurement; frequency 1 kHz; residual inductive parameter; resonance frequency; scattering parameter measurement; vector network analyzer; Capacitance; Equations; Frequency measurement; Mathematical model; Resonant frequency; Scattering parameters; Standards; Capacitance calibration; four-terminal pair; frequency dependence; resonance; scattering parameter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6251118
Filename :
6251118
Link To Document :
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