Double-shielded sample stage for single-electron devices

Author

Manninen, A.J. ; Kemppinen, A. ; Mykkänen, E. ; Koivula, H. ; Hahtela, O. ; Maisi, V.F. ; Lotkhov, S.V. ; Zorin, A.B. ; Saira, O. -P ; Pekola, J.P.

Author_Institution

Centre for Metrol. & Accreditation (MIKES), Espoo, Finland

fYear

2012

fDate

1-6 July 2012

Firstpage

704

Lastpage

705

Abstract

We demonstrate that while significant efforts have been put on filtering the signal lines of low-temperature metallic nanoscale devices, the quality of radiation shielding has been overlooked. We describe a double-shielded sample stage that is shown to significantly improve the performance of single-electron devices. We also demonstrate a record-low density of quasi-particles in a superconductor.

Keywords

electromagnetic shielding; interference suppression; nanoelectronics; quasiparticles; single electron devices; superconducting junction devices; low temperature metallic nanoscale device; quasiparticle; radiation shielding; shielded sample stage; signal line filtering; single electron device; superconductor; Powders; Superconducting device noise; Superconducting filters; Thermal noise; Tunneling; Electromagnetic shielding; charge pumps; filtering; metrology; nanoscale devices; single electron devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251124

Filename

6251124

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2751782