• DocumentCode
    2751818
  • Title

    Photoluminescence study of resonant-tunneling transistor

  • Author

    Ohno, Y. ; Kishimoto, S. ; Mizutani, T. ; Akeyoshi, T.

  • Author_Institution
    Nagoya Univ., Japan
  • fYear
    1997
  • fDate
    8-11 Sep 1997
  • Firstpage
    613
  • Lastpage
    616
  • Abstract
    The photoluminescence (PL) of a resonant-tunneling transistor was studied. An excitation energy close to the bandgap energy of the GaAs collector layer was chosen so as to excite neither the barrier layer nor the quantum well, resulting in simple luminescence spectra. The PL signal shows a strong correlation with resonant-tunneling current. The PL peak position shifts to lower energy with increasing collector voltage, Vce indicating the existence of the quantum-confined Stark effect. The Vce dependencies of PL intensity and linewidth suggests charge buildup in the quantum well. The effect of gate voltage on PL spectra suggests a quantum confinement by the potential of the gate depletion layer
  • Keywords
    photoluminescence; quantum confined Stark effect; resonant tunnelling transistors; spectral line breadth; GaAs collector layer; InGaAs-GaAs; PL intensity; PL peak position; bandgap energy; barrier layer; charge buildup; collector voltage; excitation energy; gate depletion layer; gate voltage; linewidth; photoluminescence; quantum well; quantum-confined Stark effect; resonant-tunneling current; resonant-tunneling transistor; simple luminescence spectra; Diodes; Gallium arsenide; Laser excitation; Luminescence; Photoluminescence; Quantum dot lasers; Quantum well lasers; Resonance; Resonant tunneling devices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 1997 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7503-0556-8
  • Type

    conf

  • DOI
    10.1109/ISCS.1998.711752
  • Filename
    711752