DocumentCode
2751818
Title
Photoluminescence study of resonant-tunneling transistor
Author
Ohno, Y. ; Kishimoto, S. ; Mizutani, T. ; Akeyoshi, T.
Author_Institution
Nagoya Univ., Japan
fYear
1997
fDate
8-11 Sep 1997
Firstpage
613
Lastpage
616
Abstract
The photoluminescence (PL) of a resonant-tunneling transistor was studied. An excitation energy close to the bandgap energy of the GaAs collector layer was chosen so as to excite neither the barrier layer nor the quantum well, resulting in simple luminescence spectra. The PL signal shows a strong correlation with resonant-tunneling current. The PL peak position shifts to lower energy with increasing collector voltage, Vce indicating the existence of the quantum-confined Stark effect. The Vce dependencies of PL intensity and linewidth suggests charge buildup in the quantum well. The effect of gate voltage on PL spectra suggests a quantum confinement by the potential of the gate depletion layer
Keywords
photoluminescence; quantum confined Stark effect; resonant tunnelling transistors; spectral line breadth; GaAs collector layer; InGaAs-GaAs; PL intensity; PL peak position; bandgap energy; barrier layer; charge buildup; collector voltage; excitation energy; gate depletion layer; gate voltage; linewidth; photoluminescence; quantum well; quantum-confined Stark effect; resonant-tunneling current; resonant-tunneling transistor; simple luminescence spectra; Diodes; Gallium arsenide; Laser excitation; Luminescence; Photoluminescence; Quantum dot lasers; Quantum well lasers; Resonance; Resonant tunneling devices; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location
San Diego, CA
Print_ISBN
0-7503-0556-8
Type
conf
DOI
10.1109/ISCS.1998.711752
Filename
711752
Link To Document