Quantifying Geometry Parameters of Defect in Multi-layered Structures from Eddy Current Nondestructive Evaluation Signals by Using Genetic Algorithm

Author

Ye, Bo ; Zhang, Guangxin ; Huang, Pingjie ; Fan, Mengbao ; Zheng, Song ; Zhou, Zekui

Author_Institution

Dept. of Control Sci. & Eng.,, Zhejiang Univ.,, Hangzhou,

Volume

2

fYear

0

fDate

0-0 0

Firstpage

5358

Lastpage

5362

Abstract

In order to detect defects in multilayered conductive structures, a novel approach to accurately quantify the two-dimensional axial symmetry defect geometry parameters from eddy current nondestructive evaluation (ECNDE) signals is presented. The method uses a finite element forward model to simulate the underlying physical process and the genetic algorithm (GA) to solve the inverse problem. Experimental results confirm the validity of the approach

Keywords

eddy current testing; finite element analysis; flaw detection; genetic algorithms; inverse problems; multilayers; axial symmetry defect geometry parameters; defect measurement; eddy current nondestructive evaluation signals; finite element forward model; genetic algorithm; inverse problem; multilayered conductive structures; multilayered structures; quantifying geometry parameters; Coils; Conducting materials; Eddy currents; Finite element methods; Genetic algorithms; Genetic engineering; Geometry; Impedance; Inverse problems; Partial differential equations; Defect measurement; Eddy current nondestructive evaluation (ECNDE); Finite element method (FEM); Genetic algorithm (GA); Multi-layered structures;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on

Conference_Location

Dalian

Print_ISBN

1-4244-0332-4

Type

conf

DOI

10.1109/WCICA.2006.1714094

Filename

1714094