Title :
Quantifying Geometry Parameters of Defect in Multi-layered Structures from Eddy Current Nondestructive Evaluation Signals by Using Genetic Algorithm
Author :
Ye, Bo ; Zhang, Guangxin ; Huang, Pingjie ; Fan, Mengbao ; Zheng, Song ; Zhou, Zekui
Author_Institution :
Dept. of Control Sci. & Eng.,, Zhejiang Univ.,, Hangzhou,
Abstract :
In order to detect defects in multilayered conductive structures, a novel approach to accurately quantify the two-dimensional axial symmetry defect geometry parameters from eddy current nondestructive evaluation (ECNDE) signals is presented. The method uses a finite element forward model to simulate the underlying physical process and the genetic algorithm (GA) to solve the inverse problem. Experimental results confirm the validity of the approach
Keywords :
eddy current testing; finite element analysis; flaw detection; genetic algorithms; inverse problems; multilayers; axial symmetry defect geometry parameters; defect measurement; eddy current nondestructive evaluation signals; finite element forward model; genetic algorithm; inverse problem; multilayered conductive structures; multilayered structures; quantifying geometry parameters; Coils; Conducting materials; Eddy currents; Finite element methods; Genetic algorithms; Genetic engineering; Geometry; Impedance; Inverse problems; Partial differential equations; Defect measurement; Eddy current nondestructive evaluation (ECNDE); Finite element method (FEM); Genetic algorithm (GA); Multi-layered structures;
Conference_Titel :
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0332-4
DOI :
10.1109/WCICA.2006.1714094
