Title :
Proceedings of the Ninth Asian Test Symposium
Abstract :
The following topics were dealt with. CAD tools; mixed-signal test; BIST; fault simulation; timing simulation; fault analysis; functional testing; test generation; embedded core testing; memory testing; DFT; fault tolerance; low-power testing; self-checking circuits; and concurrent fault detection
Keywords :
automatic testing; built-in self test; circuit CAD; design for testability; fault simulation; fault tolerance; integrated circuit design; integrated circuit testing; logic testing; low-power electronics; mixed analogue-digital integrated circuits; timing; BIST; CAD tools; DFT; concurrent fault detection; embedded core testing; fault analysis; fault simulation; fault tolerance; functional testing; low-power testing; memory testing; mixed-signal test; self-checking circuits; test generation; timing simulation;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893588
