Title :
On the use of clustering and local singular spectrum analysis to remove ocular artifacts from electroencephalograms
Author :
Teixeira, A.R. ; Tomé, A.M. ; Lang, E.W. ; Gruber, P. ; Da Silva, A. Martins
Author_Institution :
DETUA/IEETA, Aveiro Univ., Portugal
fDate :
July 31 2005-Aug. 4 2005
Abstract :
We present a method based on singular spectrum analysis to remove ocular artifacts (EOG) from an electroencephalogram (EEC). After embedding the EEG signals in a feature space of time-delayed coordinates, feature vectors are clustered and the principal components (PCs) are computed locally within each cluster. Then we assume that the EOG artifact is associated with the PCs belonging to the largest eigenvalues. We incorporate a minimum description length (IMDL) criterion to estimate the number of eigenvectors needed to represent the EOG artifact faithfully. The EOG signal thus extracted is then subtracted from the original EEG signal to obtain the corrected EEG signal we are interested in.
Keywords :
electroencephalography; medical signal processing; pattern clustering; principal component analysis; EEG signals; electroencephalograms; feature vectors; minimum description length criterion; singular spectrum analysis; time-delayed coordinates; Additive noise; Data mining; Electrodes; Electroencephalography; Electrooculography; Eyes; Independent component analysis; Personal communication networks; Principal component analysis; Time series analysis;
Conference_Titel :
Neural Networks, 2005. IJCNN '05. Proceedings. 2005 IEEE International Joint Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9048-2
DOI :
10.1109/IJCNN.2005.1556298