DocumentCode
2751934
Title
A low noise-high counting rate readout system for X-ray imaging applications
Author
Zervakis, Em. ; Loukas, D. ; Haralabidis, Nikos ; Pavlidis, A.
Volume
2
fYear
2003
fDate
0-0 2003
Firstpage
361
Abstract
A system for processing signals from direct photon conversion sensors has been developed with the aim to be used for applications in X-ray imaging. The system consists of a mixed analog-digital ASIC and a digital 32-channels binary counter ASIC. The digital chips can be daisy-chained. In this way a system with high number of readout channels can be constructed. A custom made PCI card is also developed in order to control the operation of the whole system. The system is intended to operate with CdTe sensors in a luggage inspection system. The first experimental results including overall noise and counting rate are reported here.
Keywords
X-ray imaging; cadmium compounds; counting circuits; mixed analogue-digital integrated circuits; readout electronics; CdTe; PCI card; X-ray imaging; digital binary counter ASIC; digital chips; direct photon conversion sensors; high counting rate; low noise readout system; luggage inspection system; mixed analog-digital ASIC; readout channels; signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on
Print_ISBN
0-7803-7979-9
Type
conf
DOI
10.1109/SCS.2003.1227064
Filename
5731297
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