Title :
Challenges for the academic test community
Author :
Breuer, Melvin A.
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
Abstract :
Abstract only given, substantially as follows. These are exciting times for digital technology, as we see continual reductions in feature size and power supply voltage, and increases in chip size, density and speed. Unfortunately, test costs seem to demand an increasing fraction of the total production costs. The author discusses the relationship between industry and academic research from the perspective of funding, sharing of data and distribution of software
Keywords :
automatic testing; integrated circuit economics; integrated circuit testing; ATPG; VERILOG; VHDL; academe industry relationship; chip size; density; digital technology; feature size; power supply voltage; production costs; speed; test costs; test pattern generation; Automatic test pattern generation; Costs; Crosstalk; Electricity supply industry; Logic design; Power supplies; Production; Signal design; Testing; Voltage;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893590
