Title :
Image acquisition and processing for falling objects with line CCD sensor
Author :
Yan, Lei ; Lee, Choon-Young ; Zhao, Gang ; Lee, Sang-Ryong ; Ki-Man
Author_Institution :
Bae Sch. of Mech. Eng., Kyungpook Nat. Univ., Daegu
Abstract :
In many industrial and agricultural fields, we should acquire and process the image of high-speed falling objects and then to output the characteristics of those. This paper presents an image acquisition and processing system for falling objects. It is based on the Texas Instrumentspsila TMS320C6416T (DSP6416), a high performance digital signal processor and Alterapsilas Field programmable gate array (FPGA) EP3C25F324. The image is captured by line CCD sensor and then the digital image data converted by analogue front-end (AFE) are transferred into FPGA, after pre-processing they are transferred into DSP6416 through the interface of first in first out (FIFO) in FPGA and external memory interfaces (EMIF) of DSP6416. Then the image data are processed in DSP6416. The controller area network (CAN) communication interface is provided for the command transfer between main PC and the system. Also this paper proposes a novel real-time method to get the areas, the average gray values and the centerspsila positions of the falling objects with line CCD sensor. Experimental results show that this system and the novel method are useful and powerful.
Keywords :
CCD image sensors; controller area networks; digital signal processing chips; field programmable gate arrays; image processing; FPGA; Texas Instrumentspsila TMS320C6416T (DSP6416); analogue front-end; controller area network; digital signal processor; external memory interfaces; falling objects; field programmable gate array; first in first out interface; image acquisition; image processing; line CCD sensor; Charge coupled devices; Charge-coupled image sensors; Communication system control; Digital images; Digital signal processors; Field programmable analog arrays; Field programmable gate arrays; Image converters; Instruments; Sensor phenomena and characterization;
Conference_Titel :
Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-2170-1
Electronic_ISBN :
1935-4576
DOI :
10.1109/INDIN.2008.4618296