DocumentCode
2751998
Title
Taiwan test industry session: value added testing in the new millennium
Author
Lee, Chung-Len
Author_Institution
National Chiao Tung University
fYear
2000
fDate
2000
Firstpage
13
Lastpage
13
Keywords
Business; Circuit testing; Foundries; Industrial economics; Integrated circuit testing; Manufacturing industries; Power generation economics; Protocols; RF signals; Relays;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
ISSN
1081-7735
Print_ISBN
0-7695-0887-1
Type
conf
DOI
10.1109/ATS.2000.893594
Filename
893594
Link To Document