Title :
Taiwan test industry session: value added testing in the new millennium
Author_Institution :
National Chiao Tung University
Keywords :
Business; Circuit testing; Foundries; Industrial economics; Integrated circuit testing; Manufacturing industries; Power generation economics; Protocols; RF signals; Relays;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893594
