• DocumentCode
    2752010
  • Title

    High heat flux cooling for silicon-on-silicon packaging

  • Author

    Jaeger, Richard C. ; Ellis, Charles D. ; Goodling, John S. ; Williamson, N. Vincent ; Baginski, Michael E. ; O´Barr, R.M.

  • Author_Institution
    Alabama Microelectron. Sci. & Technol. Center, Auburn Univ., AL, USA
  • fYear
    1989
  • fDate
    7-9 Feb. 1989
  • Firstpage
    104
  • Lastpage
    111
  • Abstract
    The authors report the first data on cooling of silicon substrates using pool boiling of Freon-12 and compare the results to liquid-jet impingement cooling of the same substrates. Heater fluxes of 2000 W/cm/sup 2/ at a maximum temperature rise of 50 K have been achieved using 16 jets impinging at 1 m/s. Pool boiling experiments have reached heater fluxes of 100 W/cm/sup 2/ with a 50 K temperature rise. Results from two-dimensional numerical simulation of the test section are in excellent agreement with the pool boiling data. These results indicate that both modes of cooling should be useful in cooling advanced packages. The authors demonstrate the use of monolithic integrated circuit fabrication techniques in the development of test sections for heat transfer measurements. A double-sided integrated circuit process has been used to fabricate a novel isothermal test section for direct measurement of heat transfer coefficients.<>
  • Keywords
    cooling; digital simulation; elemental semiconductors; heat sinks; integrated circuit technology; monolithic integrated circuits; packaging; silicon; thermal variables measurement; 50 K; Freon-12; Si-Si; double-sided integrated circuit; heat transfer coefficients; heat transfer measurements; high heat flux cooling; isothermal test; liquid-jet impingement cooling; monolithic integrated circuit fabrication; pool boiling; two-dimensional numerical simulation; Circuit testing; Cooling; Heat transfer; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit testing; Monolithic integrated circuits; Numerical simulation; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal and Temperature Measurement Symposium, 1989. SEMI-THERM V., Fifth Annual IEEE
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/STHERM.1989.76074
  • Filename
    76074