DocumentCode
2752074
Title
Testing mixed-signal cores: practical oscillation-based test in an analog macrocell
Author
Huertas, G. ; Vazquez, D. ; Peralías, E. ; Rueda, A. ; Huertas, J.L.
Author_Institution
Inst. de Microelectron., Seville Univ., Spain
fYear
2000
fDate
2000
Firstpage
31
Lastpage
38
Abstract
This paper presents an operational method for converting into digital the analog waveforms resulting when oscillation-based test (OBT) is applied to a mixed signal integrated circuit. Although our aim is OBT this technique can be used in structural testing in general. A complex mixed-signal macrocell is used as an example to demonstrate the pros and cons of the technique
Keywords
integrated circuit testing; mixed analogue-digital integrated circuits; OBT; analog macrocell; mixed signal integrated circuit; mixed-signal macrocell; oscillation-based test; Analog integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Costs; Integrated circuit testing; Macrocell networks; Sequential analysis; Signal design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location
Taipei
ISSN
1081-7735
Print_ISBN
0-7695-0887-1
Type
conf
DOI
10.1109/ATS.2000.893599
Filename
893599
Link To Document