Title :
Testing mixed-signal cores: practical oscillation-based test in an analog macrocell
Author :
Huertas, G. ; Vazquez, D. ; Peralías, E. ; Rueda, A. ; Huertas, J.L.
Author_Institution :
Inst. de Microelectron., Seville Univ., Spain
Abstract :
This paper presents an operational method for converting into digital the analog waveforms resulting when oscillation-based test (OBT) is applied to a mixed signal integrated circuit. Although our aim is OBT this technique can be used in structural testing in general. A complex mixed-signal macrocell is used as an example to demonstrate the pros and cons of the technique
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; OBT; analog macrocell; mixed signal integrated circuit; mixed-signal macrocell; oscillation-based test; Analog integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Costs; Integrated circuit testing; Macrocell networks; Sequential analysis; Signal design; System testing;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893599
