• DocumentCode
    2752223
  • Title

    TI-BIST: a temperature independent analog BIST for switched-capacitor filters

  • Author

    Carro, L. ; Cota, E. ; Lubaszewski, M. ; Bertrand, Y. ; Azaïs, F. ; Renovell, M.

  • Author_Institution
    Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    78
  • Lastpage
    83
  • Abstract
    This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results
  • Keywords
    analogue circuits; built-in self test; switched capacitor filters; BIST; analog BIST; simulation; switched-capacitor filters; temperature independent analog BIST; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Costs; Filters; Frequency; Oscillators; Switches; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
  • Conference_Location
    Taipei
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-0887-1
  • Type

    conf

  • DOI
    10.1109/ATS.2000.893606
  • Filename
    893606
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2752223