Title :
TI-BIST: a temperature independent analog BIST for switched-capacitor filters
Author :
Carro, L. ; Cota, E. ; Lubaszewski, M. ; Bertrand, Y. ; Azaïs, F. ; Renovell, M.
Author_Institution :
Dept. de Engenharia Eletrika, Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results
Keywords :
analogue circuits; built-in self test; switched capacitor filters; BIST; analog BIST; simulation; switched-capacitor filters; temperature independent analog BIST; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Costs; Filters; Frequency; Oscillators; Switches; Temperature sensors;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893606
