DocumentCode
2752252
Title
Laser beam profiling by waveguide technique
Author
Shulga, A.V. ; Khomchenko, A.V. ; Sotsky, A.B.
Author_Institution
Belarusian-Russian Univ., Mogilev, Belarus
fYear
2010
fDate
July 28 2010-Aug. 1 2010
Firstpage
178
Lastpage
181
Abstract
The resonant prism-coupling technique for measuring of light beam intensity distribution is presented. This approach is based on recording of the angular dependence of intensity of the reflected laser beam in the case of excitation of guided mode in testing thin-film structure. Analysis of the spatial intensity spectrum is considered.
Keywords
intensity measurement; laser modes; light reflection; measurement by laser beam; optical films; optical prisms; optical testing; optical variables measurement; optical waveguides; reflectometry; guided mode; laser beam profiling; light beam intensity distribution; light reflection; resonant prism-coupling technique; spatial intensity spectrum; thin-film structure testing; waveguide technique; Couplers; Laser beams; Laser excitation; Measurement by laser beam; Optical films; Optical waveguides; Waveguide lasers; Fourier spectrum; light beam profiling; prism coupler; waveguide;
fLanguage
English
Publisher
ieee
Conference_Titel
Laser Physics and Laser Technologies (RCSLPLT) and 2010 Academic Symposium on Optoelectronics Technology (ASOT), 2010 10th Russian-Chinese Symposium on
Conference_Location
Harbin
Print_ISBN
978-1-4244-5511-9
Type
conf
DOI
10.1109/RCSLPLT.2010.5615326
Filename
5615326
Link To Document