Title :
A feature selection method for Automated Visual Inspection systems
Author :
Garcia, Hugo C. ; Villalobos, J. Rene
Author_Institution :
Freescale Semicond., Tempe, AZ
Abstract :
Automated visual inspection (AVI) systems are nowadays considered essential in the assembly of surface mounted devices (SMD). The general goal of this research centers on developing self-training AVI systems for the inspection of SMD components. In this paper, it is proposed a new feature selection methodology based on a stepwise variable selection. The procedure uses an estimation of the marginal misclassification error rate (MER) as the figure of merit to introduce new features in the quadratic classifier used by the inspection system. This marginal error rate is estimated by using the densities of the conditional stochastic representations of the underlying quadratic discriminant function. In this paper we show that the application of the proposed methodology to the inspecting of SMD components results in significant savings of computational time in the estimation of classification error over the traditional simulation and cross-validation methods.
Keywords :
assembling; automatic test equipment; inspection; surface mount technology; SMD components; automated visual inspection systems; classification error estimation; conditional stochastic representations; cross-validation methods; feature selection method; marginal misclassification error rate; quadratic classifier; stepwise variable selection; surface mounted devices assembly; Acceleration; Assembly systems; Computational modeling; Digital images; Error analysis; Estimation error; Humans; Input variables; Inspection; Stochastic processes;
Conference_Titel :
Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-2170-1
Electronic_ISBN :
1935-4576
DOI :
10.1109/INDIN.2008.4618318