DocumentCode :
2752591
Title :
Optical filter of the window on 0∼25 degree incidence angle 980nm semiconductor detector
Author :
Peng, Lu ; Liu Guojun ; Qu Yi
Author_Institution :
Nat. Key Lab. on High Power Semicond. Lasers, Changchun Univ. of Sci. & Technol., Changchun, China
fYear :
2010
fDate :
July 28 2010-Aug. 1 2010
Firstpage :
109
Lastpage :
111
Abstract :
In this paper a window with band-pass filter is used on 980nm semiconductor detector. The window is designed with substrate HW800, materials whose index are Nh=2.4, Nl=1.7, and center wavelength 990nm. Ion Beam Associated Deposition (IBAD) is introduced to film-growing process for improving the film structure and developing the gas´ ability of reaction. And all processes are monitored by both optical and crystal controller. Finally we obtained the experimental results, with good average transmissivity Tavg>90% not only on waveband 960-1030nm at 0 incidence angle, but also on waveband 940-1000nm at 25 incidence angle. This window blocks off other waveband(400-760nm, 1100-1200nm) as noise, and obtains good signal intensity from 0°-25° incidence angle at the same time. At the same time, this design overcomes the shortcomings such as high cost and difficulty in control, in the case when double-side film-growing is necessary in traditional processes.
Keywords :
band-pass filters; integrated optics; ion beam assisted deposition; optical control; optical design techniques; optical films; optical filters; optical sensors; average transmissivity; band-pass filter; crystal controller; film structure; film-growing process; incidence angle; ion beam associated deposition; optical controller; optical filter; semiconductor detector; signal intensity; wavelength 1100 nm to 1200 nm; wavelength 400 nm to 760 nm; wavelength 940 nm to 1030 nm; window design; Band pass filters; Detectors; Optical films; Optical filters; Process control; Substrates; 980nm semiconductor detector; band-pass filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Laser Physics and Laser Technologies (RCSLPLT) and 2010 Academic Symposium on Optoelectronics Technology (ASOT), 2010 10th Russian-Chinese Symposium on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-5511-9
Type :
conf
DOI :
10.1109/RCSLPLT.2010.5615342
Filename :
5615342
Link To Document :
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