DocumentCode
2752834
Title
Foreword
fYear
2009
fDate
23-26 Nov. 2009
Abstract
Presents the welcome message from the conference proceedings.
Keywords
Asia; Circuit testing; Cities and towns; Conferences; Educational technology; Integrated circuit testing; Marine technology; South America; System testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2009. ATS '09.
Conference_Location
Taichung
ISSN
1081-7735
Print_ISBN
978-0-7695-3864-8
Type
conf
DOI
10.1109/ATS.2009.5
Filename
5359254
Link To Document