Cyclic greedy generation method for limited number of IDDQ tests

This paper proposes a generation method (called Cyclic Greedy generation method) of IDDQ test sets for maximizing the number of detected faults under the constraint that the number of test patterns is limited. First this method greedily generates the given limited number of test patterns, then it greedily re-generates each pattern sequentially all over again and again in a cyclic manner. Each test pattern is generated by the iterative improvement method of random patterns. The experimental results show that the number of undetected faults remained by the Cyclic Greedy generation method is 13% less than by the pure greedy generation method in average for the large ISCAS85&89 circuits