Title :
Study on the distribution of trap levels in PI by OPO laser
Author :
He, Lijuan ; Wang, Dongni ; Cao, Jinglei ; Zhao, Lei ; Wang, Xuan ; Lei, Qingquan
Author_Institution :
Harbin Univ. of Sci. & Technol., Harbin, China
fDate :
July 28 2010-Aug. 1 2010
Abstract :
In this paper, the photo-stimulated discharge (PSD) current spectra of polyimide (PI) are obtained by the optical parametric oscillator (OPO) laser to characterize the deep space charge traps in the dielectric materials. The result shows that the energy level of charge traps in the PI film is distributed in 3.10~4.10eV, and the main part concentrates in 3.35~3.85eV. These data can provide experimental basis for the further research and improvement on electrical properties of materials.
Keywords :
deep levels; dielectric thin films; optical parametric oscillators; polymer films; space charge; charge trap energy level; deep space charge traps; dielectric materials; electrical properties; optical parametric oscillator laser; photostimulated discharge current spectra; polyimide films; Current measurement; Discharges; Films; Laser excitation; Measurement by laser beam; Space charge; optical parametric oscillator; space charge; trap;
Conference_Titel :
Laser Physics and Laser Technologies (RCSLPLT) and 2010 Academic Symposium on Optoelectronics Technology (ASOT), 2010 10th Russian-Chinese Symposium on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-5511-9
DOI :
10.1109/RCSLPLT.2010.5615368
