Frequency stability of high overtone bulk acoustic resonators

Author

Bailey, D.S. ; Driscoll, M.M. ; Jelen, R.A. ; McAvoy, B.R.

Author_Institution

Westinghouse Electron. Syst. Group, Baltimore, MD, USA

fYear

1990

fDate

4-7 Dec 1990

Firstpage

509

Abstract

The authors report the results of phase noise measurements for high overtone bulk acoustic resonators (HBARs) operating at 640 MHz with insertion losses of 10-15 dB and unmatched Qs greater than 110 K. Noise measurements made on these resonators with input drive levels of 16 dBm have shown self-noise levels of S_y(f =100 Hz)=8.0×10^-26 for 1/f noise, which represents the state-of-the-art for a UHF resonator. It is concluded that HBAR technology provides the means for generating UHF and microwave signals exhibiting short-term frequency stability superior to that obtainable using quartz resonator based sources

Keywords

acoustic microwave devices; acoustic resonators; frequency stability; microwave generation; random noise; 1/f noise; 10 to 15 dB; 640 MHz; UHF resonator; high overtone bulk acoustic resonators; insertion losses; microwave signals; phase noise measurements; self-noise levels; short-term frequency stability; Acoustic measurements; Frequency; Insertion loss; Loss measurement; Noise level; Noise measurement; Phase measurement; Phase noise; Q measurement; Stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1990. Proceedings., IEEE 1990

Conference_Location

Honolulu, HI

Type

conf

DOI

10.1109/ULTSYM.1990.171417

Filename

171417