Title :
Frequency stability of high overtone bulk acoustic resonators
Author :
Bailey, D.S. ; Driscoll, M.M. ; Jelen, R.A. ; McAvoy, B.R.
Author_Institution :
Westinghouse Electron. Syst. Group, Baltimore, MD, USA
Abstract :
The authors report the results of phase noise measurements for high overtone bulk acoustic resonators (HBARs) operating at 640 MHz with insertion losses of 10-15 dB and unmatched Qs greater than 110 K. Noise measurements made on these resonators with input drive levels of 16 dBm have shown self-noise levels of Sy(f =100 Hz)=8.0×10-26 for 1/f noise, which represents the state-of-the-art for a UHF resonator. It is concluded that HBAR technology provides the means for generating UHF and microwave signals exhibiting short-term frequency stability superior to that obtainable using quartz resonator based sources
Keywords :
acoustic microwave devices; acoustic resonators; frequency stability; microwave generation; random noise; 1/f noise; 10 to 15 dB; 640 MHz; UHF resonator; high overtone bulk acoustic resonators; insertion losses; microwave signals; phase noise measurements; self-noise levels; short-term frequency stability; Acoustic measurements; Frequency; Insertion loss; Loss measurement; Noise level; Noise measurement; Phase measurement; Phase noise; Q measurement; Stability;
Conference_Titel :
Ultrasonics Symposium, 1990. Proceedings., IEEE 1990
Conference_Location :
Honolulu, HI
DOI :
10.1109/ULTSYM.1990.171417
