Title :
Analysis of the electrical characteristics of LDMOSFET under various temperature
Author :
Son, Jeong-Man ; Yuk, Seung-Bum ; Lee, Jae-Hyun ; Kwak, Jae-chang ; Kwon, Jong-Ki ; Koo, Yong-Seo
Author_Institution :
Seokyeong Univ., Daejeon
fDate :
Oct. 30 2007-Nov. 2 2007
Abstract :
In this paper, we have investigated the electrical characteristics of power LDMOSFETs having different gate lengths(2.1 mum -3 mum) in the temperature range of 100 K-500 K. The specific on-resistance and the off-state breakdown voltage increase with temperature. The result shows that the specific on- resistance increases exponentially with the exponent of 2.2 and, by contrast, the off-state breakdown voltage increases linearly with a slope of 100 mV/K (Drift region concentration of measured device: 2 times 1015 cm-3). As a result, Ron/BV, known for a figure of merit of power device, increases with temperature.
Keywords :
power MOSFET; semiconductor device breakdown; electrical characteristics; off-state breakdown voltage; on-resistance; power LDMOSFET; temperature 100 K to 500 K; Electric variables; Electric variables measurement; Low voltage; MOSFET circuits; Power MOSFET; Power measurement; Temperature control; Temperature distribution; Threshold voltage; Transconductance;
Conference_Titel :
TENCON 2007 - 2007 IEEE Region 10 Conference
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-1272-3
Electronic_ISBN :
978-1-4244-1272-3
DOI :
10.1109/TENCON.2007.4428972