Title :
Cumulative bibliography of articles on semiconductor thermal and temperature testing - 1989
Author_Institution :
SAGE Enterprises Inc., Palo Alto, CA, USA
Abstract :
This bibliography of 340 papers lists articles on semiconductor thermal and/or temperature characteristics, measurement techniques and results, hardware applications, and other pertinent information.<>
Keywords :
characteristics measurement; semiconductor device testing; temperature measurement; bibliography; semiconductor thermal testing; temperature characteristics; temperature testing;
Conference_Titel :
Semiconductor Thermal and Temperature Measurement Symposium, 1989. SEMI-THERM V., Fifth Annual IEEE
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/STHERM.1989.76083
