New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults

Due to the rapid decrease of technology feature size speed related faults, such as Address Decoder Delay Faults (ADDFs), are becoming very important. In addition, increased leakage currents demand for improved tests for Bit Line Imbalance Faults (BLIFs)(caused by memory cell pass transistor leakage). This paper contributes to new and improved algorithms for detecting these faults. First it provides an improved version of existing GalPat algorithm and introduces two new algorithms to detect ADDFs; the paper also shines a new light on the use of the different stress combinations (counting methods, data-backgrounds) and their importance for the detection of ADDFs. Second, it provides an improved algorithm for detecting BLIFs; it increases the defect coverage by being able to detect lower leakage currents.