Abstract :
This index covers all technical items that appeared in this conference.
Keywords :
Analytical models; Context modeling; Control systems; Data models; Helium; IEC; Solid modeling;
Conference_Titel :
Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-2170-1
DOI :
10.1109/INDIN.2008.4618390
