• DocumentCode
    2753879
  • Title

    Bridging fault diagnosis in the absence of physical information

  • Author

    Lavo, David B. ; Chess, Brian ; Larrabee, Tracy ; Ferguson, F. Joel ; Saxena, Jayashree ; Butler, Kenneth M.

  • Author_Institution
    Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    887
  • Lastpage
    893
  • Abstract
    Effective bridging fault diagnosis requires reducing the (2 n) number of bridging faults to a handful of candidates. A preliminary step can reduce the O(n2) candidates to a manageable O(n) candidates by using layout information to eliminate those bridging faults that are very unlikely to be shorted together. This step removes from consideration those faults that match the fault signature but are physically impossible. However, sometimes-perhaps due to issues of intellectual property or because the degree of information stored about a circuit changes over its lifecycle-the physical design of the circuit is not available, and the number of nodes is too large to explicitly consider all pairs. In this paper we present two ways to provide successful diagnoses without access to physical information. The second method produces optimal diagnoses under our ranking criteria. Either technique can be used in conjunction with information extracted from the physical design to allow for diagnoses of much larger circuits than previously possible
  • Keywords
    application specific integrated circuits; circuit optimisation; fault diagnosis; integrated circuit testing; integrated circuit yield; logic testing; ASIC; IC testing; bridging fault diagnosis; fault signature; layout information; optimal diagnoses; ranking criteria; Bridge circuits; Circuit faults; Data mining; Dictionaries; Fault diagnosis; Instruments; Intellectual property; Manufacturing processes; Production systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639703
  • Filename
    639703