DocumentCode
2753923
Title
Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis
Author
Voorakaranam, R. ; Chakrabarti, S. ; Hou, J. ; Gomes, A. ; Cherubal, S. ; Chatterjee, A. ; Kao, W.
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1997
fDate
1-6 Nov 1997
Firstpage
903
Lastpage
912
Abstract
In this paper we discuss the capabilities of the MiST PROFIT (Mixed Signal Test Program for Fault Insertion and Testing) software for hierarchical fault modeling, tolerance modeling, fault clustering and fault diagnosis of complex mixed-signal systems. The software is designed to exploit the relationships between high level system specifications and module-level faults in complex and nonlinear mixed signal systems. Hierarchical simulation based methods are used to capture fault effects at different levels of circuit abstraction. The key features of our approach are: (a) the ability to compute tolerance effects from nonlinear behavioral models at different levels of circuit design hierarchy accurately using low-cost simulation based methods, (b) the ability to perform compaction of fault effects while transferring fault effects from the leaf cells to the highest level behavioral models, (c) the ability to capture parametric (soft) failure effects over the entire anticipated range of faulty parameter values and (d) the ability to construct fault dictionaries given a set of least replaceable units to diagnose
Keywords
digital simulation; fault diagnosis; integrated circuit modelling; mixed analogue-digital integrated circuits; multichip modules; MiST PROFIT; circuit abstraction; complex mixed-signal systems; fault clustering; fault diagnosis; fault dictionaries; fault effects; fault simulation; faulty parameter values; hierarchical specification-driven analog fault modeling; high level system specifications; leaf cells; least replaceable units; low-cost simulation based methods; mixed signal test program; module-level faults; nonlinear behavioral models; nonlinear mixed signal systems; parametric failure effects; soft failure effects; tolerance modeling; Circuit faults; Circuit simulation; Computational modeling; Fault diagnosis; High performance computing; Signal design; Software design; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639705
Filename
639705
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