Title :
Behavioral fault simulation in VHDL
Author :
Ward, P.C. ; Armstrong, J.R.
Author_Institution :
Robertshaw Controls Co., Richmond, VA, USA
Abstract :
Two tools which facilitate a fault simulation of behavioral models described using the VHSIC hardware description language (VHDL) are presented. The first tool is the behavioral fault mapper (BFM). The BFM algorithm accepts a fault-free VHDL model and a fault-list of N faults from which it produces N faulty models. The process of mapping the faults in the fault-list onto copies of the original VHDL model is automated. The N faulty models are immediately suitable for fault simulation. The second tool presented is test bench generator (TBG). The TBG algorithm creates the VHDL testbench and all other files necessary to complete a batch-mode fault simulation of the N faulty models
Keywords :
VLSI; electronic engineering computing; fault location; integrated circuit testing; specification languages; VHDL; VHSIC hardware description language; batch-mode fault simulation; behavioral fault mapper; behavioural fault simulation; fault simulation; fault-list; test bench generator; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Hardware design languages; Integrated circuit interconnections; Large scale integration; System testing;
Conference_Titel :
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-89791-363-9
DOI :
10.1109/DAC.1990.114922