Title :
A variable observation time method for testing delay faults
Author :
Mao, Wei-Wei ; Ciletti, Michael D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA
Abstract :
Test methodologies for delay faults usually observe output patterns at a single observation time, and the same observation time is used for all faults in the circuit under test. It is shown that use of a single observation time is not advantageous for testing delay faults, and the detection threshold can be dramatically improved by using a testing methodology that allows variable, fault-dependent, and output-dependent observation times. A `waveform-type´ simulation method is used for calculating detection thresholds for definitely detectable faults. Statistical distributions of delay fault detection thresholds are presented for ten benchmark circuits
Keywords :
logic testing; benchmark circuits; delay fault detection thresholds; delay faults; variable observation time; Circuit faults; Circuit testing; Clocks; Delay effects; Electrical fault detection; Fault detection; Latches; Logic devices; Springs; Statistical distributions;
Conference_Titel :
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-89791-363-9
DOI :
10.1109/DAC.1990.114949
