Title :
Structuring STIL for incremental test development
Author :
Maston, Gregory A.
Author_Institution :
Semicond. Products Sect., Motorola Inc., Chandler, AZ, USA
Abstract :
The Standard Test Interface Language (STIL) facilitates the transportation of digital test data from creation, to use on Automated Test Equipment. Constructs of the language, when used properly, support this operation. But these same constructs may also complicate the process. This paper discusses the appropriate use of STIL constructs for incremental test development, including an organizing paradigm for STIL data
Keywords :
automatic test equipment; automatic test software; electronic equipment testing; high level languages; software standards; Automated Test Equipment; Standard Test Interface Language; automatic testing; design for testing; digital test data; incremental test development; Automatic testing; Circuit testing; Costs; Electronic design automation and methodology; Integrated circuit testing; Semiconductor device testing; Silicon; Standards development; Test equipment; Transportation;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639717
