Moiré fringe measurement system of optical length modulation based on FPGA

Author

Wei, Qu ; Hong-An, Ye ; Hui-Min, Zheng ; Ying-Xiao, Xie

Author_Institution

Key Lab. of Electron. Eng., Heilongjiang Univ., Harbin, China

fYear

2010

fDate

July 28 2010-Aug. 1 2010

Firstpage

42

Lastpage

45

Abstract

A novel method for measuring moiré fringe is proposed according to moiré fringe characteristics in each interference region of double grating interferometer. Moiré fringe pattern in Talbot image region II only shifts with the thickness of phased object when adjusting its position. The phased object is composed by two relative movable optic wedges. The method of micro-displacement measurement using this optic characteristic in this region can be verified by MATLAB. A new embedded differential direction recognizing and 4-subdividing method for moiré fringes is adopted by using EP2C8Q208. In moiré fringe hardware detecting system, 4-subdividing, direction recognizing and counting module are designed, and logical and timing diagram is simulated by VHDL. In comparison with others, this design possesses low cost, high flexibility, high system synchronization and easy upgrade.

Keywords

Talbot effect; diffraction gratings; field programmable gate arrays; light interference; light interferometers; moire fringes; optical modulation; EP2C8Q208; FPGA; MATLAB; Moire fringe measurement; Talbot image; VHDL; double grating interferometer; microdisplacement measurement; optical length modulation; Adaptive optics; Gratings; High speed optical techniques; Optical imaging; Optical interferometry; Optical modulation; Synchronization; FPGA; moiré fringe; optic path modulation; optic wedges;

fLanguage

English

Publisher

ieee

Conference_Titel

Laser Physics and Laser Technologies (RCSLPLT) and 2010 Academic Symposium on Optoelectronics Technology (ASOT), 2010 10th Russian-Chinese Symposium on

Conference_Location

Harbin

Print_ISBN

978-1-4244-5511-9

Type

conf

DOI

10.1109/RCSLPLT.2010.5615416

Filename

5615416