Title :
A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis
Author :
Barragan, Manuel J. ; Fiorelli, Rafaella ; Vazquez, David ; Rueda, Adoración ; Huertas, José L.
Author_Institution :
Centro Nat. de Microelectron., Univ. de Sevilla Ed. IMSE-CNM, Sevilla, Spain
Abstract :
This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.
Keywords :
built-in self test; integrated circuit testing; spectral analysis; system-on-chip; BIST; RF system testing; SoC; built-in test; envelope response analysis; functional characterization; nonlinearity specifications; spectral analysis; Built-in self-test; CMOS technology; Costs; Envelope detectors; Proposals; Radio frequency; System testing; System-on-a-chip; Test equipment; Transceivers; Analog BIST; RF BIST; RF Test;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.14
