DocumentCode
2754647
Title
1-V, 30-MHz memory-macrocell-circuit technology with a 0.5-/spl mu/m multi-threshold CMOS
Author
Date, S. ; Shibata, N. ; Mutoh, S.-I. ; Yamada, J.
Author_Institution
NTT LSI Labs., Kanagawa, Japan
fYear
1994
fDate
10-12 Oct. 1994
Firstpage
90
Lastpage
91
Abstract
Describes the circuit technology of a 1-V high-speed memory macrocell based on a new concept using multi-threshold CMOS (MT-CMOS). Some primitive circuits using lower threshold-voltage (Vth) transistors in memories have already been proposed for giga-scale DRAMs; low-voltage SRAM-based memory circuit scheme has not been clarified yet. The circuit technology described here makes it possible to reduce power consumption in memories without sacrificing operating speed. This is done by applying two kinds of CMOS transistors with different Vths effectively to all memory blocks. The use of a sleep function to reduce the stand-by current is also presented. 30-MHz configurable memory macrocells have been developed that operate at a voltage as low as 1 V by combining this new technology with O.5/spl mu/m process technology. These macrocells can be powered by a single NiCd battery that is ideal for portable applications.
Keywords
cellular arrays; 0.5 micron; 1 V; 30 MHz; giga-scale DRAMs; high-speed memory macrocell; memory-macrocell-circuit technology; multi-threshold CMOS; operating speed; portable applications; power consumption; sleep function; stand-by current; threshold voltage; CMOS technology; Circuit noise; Decoding; Large scale integration; Leakage current; Low voltage; Macrocell networks; Memory management; Synthetic aperture sonar; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics, 1994. Digest of Technical Papers., IEEE Symposium
Conference_Location
San Diego, CA, USA
Print_ISBN
0-7803-1953-2
Type
conf
DOI
10.1109/LPE.1994.573216
Filename
573216
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