Dynamic Compaction in SAT-Based ATPG

SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compaction procedure for SAT-based ATPG which utilizes internal data structures of the SAT solver to extract essential fault detection conditions and to generate patterns which cover multiple faults. We complement this technique by a state-of-the-art forward-looking reverse-order simulation procedure. Experimental results obtained for an industrial benchmark circuit suite show that the new method outperforms earlier static approaches by approximately 23%.