DocumentCode :
2754991
Title :
Speeding up SAT-Based ATPG Using Dynamic Clause Activation
Author :
Eggersgluss, Stephan ; Tille, Daniel ; Drechsler, Rolf
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
fYear :
2009
fDate :
23-26 Nov. 2009
Firstpage :
177
Lastpage :
182
Abstract :
SAT-based ATPG turned out to be a robust alternative to classical structural ATPG algorithms such as FAN. The number of unclassified faults can be significantly reduced using a SAT-based ATPG approach. In contrast to structural ATPG, SAT solvers work on a Boolean formula in conjunctive normal form (CNF). This results in some disadvantages for SAT solvers when applied to ATPG, e.g. CNF transformation time and loss of structural knowledge. As a result, SAT-based ATPG algorithms are very robust for hard-to-test faults, but suffer from the overhead for easy-to-test faults. We propose the SAT technique dynamic clause activation (DCA) in order to reduce the run time gap between structural and SAT-based ATPG algorithms and, at the same time, retain the high level of robustness. Using DCA, the SAT solver works on a partial formula of a logic circuit which is dynamically extended during the search process using structural knowledge. Furthermore, efficient dynamic learning techniques can be easily integrated within the proposed technique. The approach is evaluated on large industrial circuits.
Keywords :
Boolean algebra; automatic test pattern generation; computability; fault simulation; Boolean formula; CNF transformation time; FAN; SAT solvers; SAT-based ATPG; classical structural ATPG algorithms; conjunctive normal form; dynamic clause activation; easy-to-test faults; efficient dynamic learning techniques; hard-to-test faults; industrial circuits; logic circuit; search process; structural knowledge; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Compaction; Computer science; Delay; Logic circuits; Robustness; Test pattern generators; ATPG; CNF; Formal methods; SAT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3864-8
Type :
conf
DOI :
10.1109/ATS.2009.26
Filename :
5359366
Link To Document :
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