Title :
Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing
Author :
Lee, Lung-Jen ; Tseng, Wang-Dauh ; Lin, Rung-Bin ; Yu, Chi-Wei
Author_Institution :
Dept. of Comput. Sci. & Eng., Yuan Ze Univ., Chungli, Taiwan
Abstract :
Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to generate the low power test set. Experimental results show, the two problems, especially in the reduction of testing power, can be significantly improved with limited hardware overhead.
Keywords :
VLSI; built-in self test; circuit feedback; integrated circuit testing; low-power electronics; shift registers; BIST; LFSR; VLSI testing; built-in self-test; low-power scan testing; multiple linear feedback shift registers; test data; testing power; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Hardware; Integrated circuit testing; Linear feedback shift registers; Power generation; System testing; BIST; low-power testing; minimum transition fill; multiple LFSRs; test data compression;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.50
