Title :
A Practical DFT Approach for Complex Low Power Designs
Author :
Kifli, Augusli ; Chen, Y.W. ; Tsay, Y.W. ; Wu, K.C.
Author_Institution :
Faraday Technol. Corp., Hsinchu, Taiwan
Abstract :
Low power designs create new challenges in design implementation, verification and testing. DFT practice that overlooks test power may result in yield loss/overkill during manufacturing test. This paper addresses the practical problems often encountered during DFT implementation and manufacturing test for complex low power designs.
Keywords :
design for testability; low-power electronics; production testing; DFT; complex low power design; design for testability; design implementation; design testing; design verification; manufacturing test; test power problem; yield loss; Automatic test pattern generation; Circuit testing; Consumer electronics; Design for testability; Dynamic voltage scaling; Energy consumption; Job shop scheduling; Logic testing; Pulp manufacturing; Switches; ATPG; DFT; MSMV; low-power;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.61
