Title :
A Systematic Iron Loss Evaluating Scheme for Electromagnetic Steel Products
Author :
Liu, Cheng-Tsung ; Liu, Li-Yang ; Lin, Sheng-Yang
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
To provide detailed information of electromagnetic steels to potential customers, comprehensive test results that can properly indicate the iron losses of those laminated products at different operational specifications are desired from the steel manufacturers. However, with limited experimental measurements, the available datasheets can only cover some typical information that were determined from common Epstein Frame tests, and additional data regarding possible iron losses beyond the conducted measurement setups will thus be estimated by numerical approximations. Accuracies of applying these data for related machine performance evaluations at those operational conditions are always uncertain, and more convincing datasheet that can adequately characterize the electromagnetic steel properties is certainly expected. Based on Preisach model and measured information, a systematic scheme that can establish the generalized hysteresis characteristics of the electromagnetic steel will be proposed. Supported by experimental measurements and devised analytical models, confident and comprehensive iron losses of those energy conversion mechanisms constructed by laminated steels can be adequately evaluated at all feasible operational specifications.
Keywords :
direct energy conversion; electromagnetic devices; equipment evaluation; iron; losses; steel manufacture; Epstein Frame tests; Preisach model; electromagnetic steel products; energy conversion; laminated products; machine performance evaluations; numerical approximations; operational specifications; steel manufacturers; systematic iron loss evaluating scheme; Electromagnetics; Iron; Loss measurement; Magnetic flux; Magnetic hysteresis; Magnetization; Steel;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2010 IEEE
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4244-6393-0
DOI :
10.1109/IAS.2010.5615500